UtamaCarian Analisis
i-CRIM AFM 01
Topography (AFM) (contact /semi contact/non-contact)(1 quality image). Thickness of sample.
Mencerap topograpy secara mekanikal sampel thin film (flat surface), powder, bulk sampel
Warga UKM
RM 100.00
/ analysis
Luar UKM
RM 245.00
/ analysis
AFM 01
Topography (AFM) (contact /semi contact/non-contact)(1 quality image). Thickness of sample.
Info
Mencerap topograpy secara mekanikal sampel thin film (flat surface), powder, bulk sampel
Lokasi
Makmal Morfologi i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 100.00
Bukan Warga
RM 245.00
Unitanalysis
i-CRIM AFM 02
Topography (STM) (Scanning Tunnelling Microscope)(1 quality image)
Mencerap topograpy secara elektrikal interaction sampel fully conductive (eg: graphite, gold, platinum etc)
Warga UKM
RM 110.00
/ analysis
Luar UKM
RM 250.00
/ analysis
AFM 02
Topography (STM) (Scanning Tunnelling Microscope)(1 quality image)
Info
Mencerap topograpy secara elektrikal interaction sampel fully conductive (eg: graphite, gold, platinum etc)
Lokasi
Makmal Morfologi i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 110.00
Bukan Warga
RM 250.00
Unitanalysis
i-CRIM AFM 03
Electrical Properties / Kelvin Probe (KPM) / Conductive AFM (CP-AFM) / Electrical Force Microscope (EFM)) (1 quality image)
Mengira dan mencerap -surface potentioal, work function,conductivity untuk sampel conductive
Warga UKM
RM 130.00
/ analysis
Luar UKM
RM 280.00
/ analysis
AFM 03
Electrical Properties / Kelvin Probe (KPM) / Conductive AFM (CP-AFM) / Electrical Force Microscope (EFM)) (1 quality image)
Info
Mengira dan mencerap -surface potentioal, work function,conductivity untuk sampel conductive
Lokasi
Makmal Morfologi i-CRIM, Aras 1, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 130.00
Bukan Warga
RM 280.00
Unitanalysis
i-CRIM AFM 03
Magnetic Properties (Magnetic Force (MFM) (1 quality image)
Mencerap topography medan magnet sampel thin film (flat surface), powder, bulk sampel
Warga UKM
RM 130.00
/ analysis
Luar UKM
RM 280.00
/ analysis
AFM 03
Magnetic Properties (Magnetic Force (MFM) (1 quality image)
Info
Mencerap topography medan magnet sampel thin film (flat surface), powder, bulk sampel
Lokasi
Makmal Morfologi i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 130.00
Bukan Warga
RM 280.00
Unitanalysis
i-CRIM AFM 03
Mechanical Properties (Force Modulation (FMM) (1 quality image)
Mencerap topography mekanikal bahan sampel thin film (flat surface), powder, bulk sampel
Warga UKM
RM 130.00
/ analysis
Luar UKM
RM 280.00
/ analysis
AFM 03
Mechanical Properties (Force Modulation (FMM) (1 quality image)
Info
Mencerap topography mekanikal bahan sampel thin film (flat surface), powder, bulk sampel
Lokasi
Makmal Morfologi i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 130.00
Bukan Warga
RM 280.00
Unitanalysis
i-CRIM AFM 03
Piezoresponse Force (PFM) / Lithography/Pinpoint(adhesion force, modules, stiffness) (1 quality image)
Mencerap topography bahan piezo untuk sampel thin film (flat surface), powder, bulk sampel
Warga UKM
RM 130.00
/ analysis
Luar UKM
RM 280.00
/ analysis
AFM 03
Piezoresponse Force (PFM) / Lithography/Pinpoint(adhesion force, modules, stiffness) (1 quality image)
Info
Mencerap topography bahan piezo untuk sampel thin film (flat surface), powder, bulk sampel
Lokasi
Makmal Morfologi i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 130.00
Bukan Warga
RM 280.00
Unitanalysis
i-CRIM AFM 05
Force Measurement (Force Spectroscopy) (5 spots)
Mengira daya lekat, daya tolakan dan young modulus untuk sampel thin film (flat surface), powder, bulk sampel
Warga UKM
RM 70.00
/ analysis
Luar UKM
RM 200.00
/ analysis
AFM 05
Force Measurement (Force Spectroscopy) (5 spots)
Info
Mengira daya lekat, daya tolakan dan young modulus untuk sampel thin film (flat surface), powder, bulk sampel
Lokasi
Makmal Morfologi i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 70.00
Bukan Warga
RM 200.00
Unitanalysis
i-CRIM AFM 06
Scanning Thermal Microscope (ShTM) (1 quality image)
Mencerap tdan mengira termal conductivity sampel thin film (flat surface) dan bulk sampel
Warga UKM
RM 180.00
/ analysis
Luar UKM
RM 280.00
/ analysis
AFM 06
Scanning Thermal Microscope (ShTM) (1 quality image)
Info
Mencerap tdan mengira termal conductivity sampel thin film (flat surface) dan bulk sampel
Lokasi
Makmal i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 180.00
Bukan Warga
RM 280.00
Unitanalysis
i-CRIM AFM 07
Additional scan (1 quality image)
Tambahan image untuk semua analisis.
Warga UKM
RM 50.00
/ analysis
Luar UKM
RM 70.00
/ analysis
AFM 07
Additional scan (1 quality image)
Info
Tambahan image untuk semua analisis.
Lokasi
Makmal i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 50.00
Bukan Warga
RM 70.00
Unitanalysis
SERI AFM01
Surface topography
Atomic Force Microscopy (Easyscan 2, Nanosurf)
Warga UKM
RM 100.00
/ sample
Luar UKM
RM 200.00
/ sample
AFM01
Surface topography
Info
Atomic Force Microscopy (Easyscan 2, Nanosurf)
Lokasi
Advanced Silicon Solar Cell Fabrication Laboratory, Solar Energy Research Institute, Universiti Kebangsaan Malaysia, 43600 UKM Bangi, Selangor
PTJ
SERI
Kadar Bayaran
Warga UKM
RM 100.00
Bukan Warga
RM 200.00
Unitsample