UtamaCarian Analisis
i-CRIM AFM 01
Topography (AFM) (contact /semi contact/non-contact)(1 quality image). Thickness of sample.
Mencerap topograpy secara mekanikal sampel thin film (flat surface), powder, bulk sampel
Warga UKM
RM 100.00
/ analysis
Luar UKM
RM 245.00
/ analysis
AFM 01
Topography (AFM) (contact /semi contact/non-contact)(1 quality image). Thickness of sample.
Info
Mencerap topograpy secara mekanikal sampel thin film (flat surface), powder, bulk sampel
Lokasi
Makmal Morfologi i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 100.00
Bukan Warga
RM 245.00
Unitanalysis
i-CRIM AFM 02
Topography (STM) (Scanning Tunnelling Microscope)(1 quality image)
Mencerap topograpy secara elektrikal interaction sampel fully conductive (eg: graphite, gold, platinum etc)
Warga UKM
RM 110.00
/ analysis
Luar UKM
RM 250.00
/ analysis
AFM 02
Topography (STM) (Scanning Tunnelling Microscope)(1 quality image)
Info
Mencerap topograpy secara elektrikal interaction sampel fully conductive (eg: graphite, gold, platinum etc)
Lokasi
Makmal Morfologi i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 110.00
Bukan Warga
RM 250.00
Unitanalysis
i-CRIM AFM 03
Electrical Properties / Kelvin Probe (KPM) / Conductive AFM (CP-AFM) / Electrical Force Microscope (EFM)) (1 quality image)
Mengira dan mencerap -surface potentioal, work function,conductivity untuk sampel conductive
Warga UKM
RM 130.00
/ analysis
Luar UKM
RM 280.00
/ analysis
AFM 03
Electrical Properties / Kelvin Probe (KPM) / Conductive AFM (CP-AFM) / Electrical Force Microscope (EFM)) (1 quality image)
Info
Mengira dan mencerap -surface potentioal, work function,conductivity untuk sampel conductive
Lokasi
Makmal Morfologi i-CRIM, Aras 1, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 130.00
Bukan Warga
RM 280.00
Unitanalysis
i-CRIM AFM 03
Magnetic Properties (Magnetic Force (MFM) (1 quality image)
Mencerap topography medan magnet sampel thin film (flat surface), powder, bulk sampel
Warga UKM
RM 130.00
/ analysis
Luar UKM
RM 280.00
/ analysis
AFM 03
Magnetic Properties (Magnetic Force (MFM) (1 quality image)
Info
Mencerap topography medan magnet sampel thin film (flat surface), powder, bulk sampel
Lokasi
Makmal Morfologi i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 130.00
Bukan Warga
RM 280.00
Unitanalysis
i-CRIM AFM 03
Mechanical Properties (Force Modulation (FMM) (1 quality image)
Mencerap topography mekanikal bahan sampel thin film (flat surface), powder, bulk sampel
Warga UKM
RM 130.00
/ analysis
Luar UKM
RM 280.00
/ analysis
AFM 03
Mechanical Properties (Force Modulation (FMM) (1 quality image)
Info
Mencerap topography mekanikal bahan sampel thin film (flat surface), powder, bulk sampel
Lokasi
Makmal Morfologi i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 130.00
Bukan Warga
RM 280.00
Unitanalysis
i-CRIM AFM 03
Piezoresponse Force (PFM) / Lithography/Pinpoint(adhesion force, modules, stiffness) (1 quality image)
Mencerap topography bahan piezo untuk sampel thin film (flat surface), powder, bulk sampel
Warga UKM
RM 130.00
/ analysis
Luar UKM
RM 280.00
/ analysis
AFM 03
Piezoresponse Force (PFM) / Lithography/Pinpoint(adhesion force, modules, stiffness) (1 quality image)
Info
Mencerap topography bahan piezo untuk sampel thin film (flat surface), powder, bulk sampel
Lokasi
Makmal Morfologi i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 130.00
Bukan Warga
RM 280.00
Unitanalysis
i-CRIM AFM 05
Force Measurement (Force Spectroscopy) (5 spots)
Mengira daya lekat, daya tolakan dan young modulus untuk sampel thin film (flat surface), powder, bulk sampel
Warga UKM
RM 70.00
/ analysis
Luar UKM
RM 200.00
/ analysis
AFM 05
Force Measurement (Force Spectroscopy) (5 spots)
Info
Mengira daya lekat, daya tolakan dan young modulus untuk sampel thin film (flat surface), powder, bulk sampel
Lokasi
Makmal Morfologi i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 70.00
Bukan Warga
RM 200.00
Unitanalysis
i-CRIM AFM 06
Scanning Thermal Microscope (ShTM) (1 quality image)
Mencerap tdan mengira termal conductivity sampel thin film (flat surface) dan bulk sampel
Warga UKM
RM 180.00
/ analysis
Luar UKM
RM 280.00
/ analysis
AFM 06
Scanning Thermal Microscope (ShTM) (1 quality image)
Info
Mencerap tdan mengira termal conductivity sampel thin film (flat surface) dan bulk sampel
Lokasi
Makmal i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 180.00
Bukan Warga
RM 280.00
Unitanalysis
i-CRIM AFM 07
Additional scan (1 quality image)
Tambahan image untuk semua analisis.
Warga UKM
RM 50.00
/ analysis
Luar UKM
RM 70.00
/ analysis
AFM 07
Additional scan (1 quality image)
Info
Tambahan image untuk semua analisis.
Lokasi
Makmal i-CRIM, Aras 3, Kompleks Penyelidikan UKM, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor
Siti Zuliana Dzulkifli
PTJ
i-CRIM
Kadar Bayaran
Warga UKM
RM 50.00
Bukan Warga
RM 70.00
Unitanalysis